Structural, electrical and magnetic properties of evaporated FexNi1-x thin films

Abstract

Polycrystalline FexNi1-x thin films were successfully synthesized via physical vapor deposition under vacuum. The iron atomic content is ranging from 20 to 45%. The thin films physical properties are studied and the impact of Fe percentage on their structural, electrical and magnetic properties is examined. To determine their structure, microstructure, surface morphology, chemical compositions, electrical and magnetic properties, the deposited films were analyzed by Rutherford Backscattering Spectrometry, X-ray diffraction, atomic force microscopy, Hall Effect measurement system (HMS-5300) and Vibrating Sample Magnetometer tools. The achieved X-ray diffraction spectra exhibited face centered cubic structure with<111> preferred orientation. The crystallite size and lattice parameter increase with increasing iron content. Both of electrical resistivity and magnetoresistance decrease with increasing film thickness, whereas mobility increases. Magnetization curves infer an in-plane easy axis without any preferential direction. It is also found that Ms increases and Hc decreases with iron content increase.