Abstract

Ferroelectric lead lanthanum titanate (Pb1−x La x Ti1−x/4O3) thin films (x = 0.04 & 0.08) have been fabricated by sol-gel spin coating process on ITO coated 7059 glass substrates. Characterization of these films has been done by x-ray diffraction and atomic force microscope images. Tetragonality decrease with addition of La content. While dielectric constant and pyrocoefficient increase, Curie temperature decreases with La content. Also, there is decrease in remanent polarization and coercive field with addition of La content.

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