Abstract
Polycrystalline samples of Sm x Bi 1− x FeO 3 were prepared by standard solid state reaction technique with x=1, 0.8, 0.6, 0.4 and 0.2. The single-phase formation of the compounds was confirmed by X-ray diffraction (XRD) technique. The XRD patterns were examined for the confirmation of the crystal structure and for the calculation of the lattice parameters. The crystal structure of the sample with x=1, 0.8, 0.6, and 0.4 is orthorhombic and triclinic for x=0.2. Further these samples were characterized by IR technique to understand the aspect of bonding in Sm x Bi 1− x FeO 3. The dielectric constant ( ε′) and dissipation factor (tan δ) were measured as a function of frequency in the range 100 Hz–1 M Hz at room temperature. Also the variations of ε′ and tan δ with temperature were studied at certain fixed frequencies namely 1, 10, 100 kHz and 1 MHz. A peak in tan δ measurement observed for the sample x=0.4 as a function of frequency at room temperature reflects the occurrence of the relaxation process. The anomalous behavior in case of x=1 (i.e. SmFeO 3) has been observed as a function of temperature near 700 K, which is associated with antiferromagnetic transition. The DC and AC resistivity measurements were carried out using two probe methods and the results have been discussed.
Published Version
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