Abstract
We present an accurate description of the structural defects occurring within YBa2Cu3O7 (YBCO) films grown by chemical solution deposition (CSD) based on metal trifluoroacetates (TFA). Transmission electron microscopy (TEM) is the essential tool to identify and evaluate the microstructural defects that might act as natural pinning centers. Our study of TFA–YBCO thin films shows that the YBCO thin films contain a variety of extended defects, such as intergrowths, twin boundaries and dislocations, mainly in the basal plane. These extended defects and their interaction make up a rich variety of key microstructural features that play an important role in the YBCO thin films physical properties and performance.
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