Abstract
HgCdTe epilayers and lattice matched CdZnTe (111) substrates have been investigated by x-ray photoelectron diffraction to characterize their surface structure in regard to termination, reconstruction and relaxation as well as in regard to degradations. Well-ordered CdZnTe surfaces of stoichiometric composition were realized by Ar ion sputtering, while sputter cleaning of the HgCdTe epilayers led to a significant increase of the CdTe mole fraction in the surface region. However, the crystallinity of the HgCdTe surfaces is found to be maintained in spite of their compositional degradation. Ordered and nondegraded HgCdTe(111) surfaces are obtained by electrochemical etching. The examined (111)A and (111)B surfaces can be easily differentiated since their photoelectron diffraction patterns indicates a surprisingly perfect termination. Evidence for any reconstruction or relaxation of the investigated (111) surfaces of CdZnTe and HgCdTe is not found.
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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