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Abstract
The fundamentals of the anomalous X-ray scattering (AXS) method for materials characterization have been described by focusing our attention on the structure of non-crystalline oxide systems. This relatively new method makes it possible to provide the environmental structure around a specific element, which is not obtained from the conventional X-ray diffraction results, in multi-component non-crystalline systems. The validity and usefulness of the AXS method were demonstrated by obtaining the fine structure of GeO 2 glass, ZrO 2 amorphous, the Sr-La-Mn-B-O type ferromagnetic glass and the Cu-I-Mo-O type super-ionic conducting glass.
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