Abstract
We use neutron and X-ray diffraction to characterize the morphology of (CD) x and (CH) x films prepared by the Naarmann-Theophilou route. The mosaic distribution of chain axes normal to the plane of the film, and the longitudinal and transverse coherence lengths, are reported for cis- and trans-isomers. The only significant difference with respect to other new preparation methods is a slightly greater coherence length along the chain axes. The mosaic is intermediate between those of stretched Shirakawa and Graz-Durham materials. Bulk thermal isomerization from cis to trans is complete at 140°C.
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