Abstract
Structural characterization of photomodified microvolumes formed by tightly focusedfemtosecond laser pulses inside silica glass was carried out using synchrotron x-raydiffraction. The observed distinct separation between the O–O and Si–Si pair correlationpeaks can be interpreted as a phase separation induced by microexplosions at the focalvolume. The mechanisms of structural transitions induced by femtosecond laser pulsesinside dielectrics are discussed.
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