Abstract
Positron annihilation lifetime spectra and X-ray diffraction have been used to investigate the radiation defects produced by Fe + ion implantation in the ionic crystal KBr at the dose of 5×10 15 ions cm −2. We have found that after implantation both the short and long lifetime components of positron annihilation in KBr crystals increase while the annihilation probability of the second lifetime component decreases from 41.7 to 29.3%. This means a decrease in the number of trapping centers by pick-off annihilation since F-centers that already existed in the sample before implantation have aggregated in the halogen sublattice by electronic processes during ion implantation to become larger centers trapping positrons. The X-ray diffraction spectra show new diffraction peaks with rather strong intensities which can be either due to lattice dilation caused by the F-center aggregation, or by metallic ion precipitates.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.