Abstract
Nanocrystalline lead lanthanum titanate (Pb0.72La0.28)Ti0.93O3 (PLT) thin films with grain size of 40–60 nm were grown on Pt/Ti/SiO2/Si(100) substrates by using a sol–gel method with rapid thermal annealing process. The spontaneous electrical polarization, remnant polarization and the coercive field are 11.9 μC/cm2, 0.767 μC/cm2 and 9.38 kV/cm, respectively, for an electric field of 312 kV/cm. The refractive index n and extinction coefficient k of the nanocrystalline PLT thin film were obtained by spectroscopic ellipsometry (SE) in the range of 370–1700 nm. At 633 nm, the refractive index n, and extinction coefficient k are 2.485, and 0.00546, respectively. For PLT films grown on fused quartz substrates annealed at 650 °C, the direct band energy is found to be 3.75 eV. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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