Abstract
High-quality Nd-doped lutecium vanadate thin films on sapphire substrates have been deposited by pulsed laser deposition (KrF excimer laser). The substrate temperature during the deposition was in the range 600–700 °C under different oxygen pressure between 2 and 20 Pa. The quality of films and crystallographic relationships were assessed by X-ray diffraction, atomic force microscopy (AFM), and prism-coupling measurements. The refractive indices of the films have been inferred from dark-mode prism coupling measurements and are slightly smaller than that of the bulk crystal.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
