Abstract
Mixed films of perfluorinated pentacene and diindenoperylene are studied for their structural and optical properties on SiO2 and glass substrates. Grazing incidence X-ray diffraction shows that the compounds mix on the molecular level. Two structures are identified. Their out-of-plane lattice spacing is determined by X-ray reflectivity, and their growth morphology is characterized using atomic force microscopy. It is found that one structure consists of molecules in a standing-up and the other in a lying-down orientation. The uniaxial dielectric function of mixed films is determined with spectroscopic ellipsometry, and the in-plane optical extinction coefficient is measured by real-time differential reflectance spectroscopy during growth. The question of intermolecular coupling between perfluorinated pentacene and diindenoperylene is discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
