Abstract
The optical behaviour of point defects created by low energy electron beams is studied in multilayer KCl:LiF films, grown by thermal evaporation onto amorphous substrates at constant temperatures ranging from 30 to 350°C. The surface morphology of the samples was observed by the atomic force microscopy (AFM) technique. Large concentration of F and F-aggregate centres has been produced by 3–7 keV electron irradiation both in KCl and LiF layers which constitute the film. By pumping our films with appropriate Ar + laser lines, we measured, for the first time, the luminescence in the near infrared region due to F 2 and F 3 centres in KCl and the typical emission of F 2 and F 3 + centres in LiF in the visible region.
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