Abstract
This paper study (LixNi2-xO2) thin films with different value of x (x = 0.0, 0.15, 0.25, 0.35 and 0.45) prepared by pulse laser deposition technique (PLD) on a glass bases and annealed to (350°C). Using X-ray diffraction (XRD) and atomic force microscopy (AFM) to study the properties of synthetic and show that the (NiO) film has face centre cubic structure (fcc), while the (LixNi2-xO2) films of the ratio (0.15 to 0.45) has a hexagonal installation and grain size increase with the doping. Optical properties studied within the specified range of wavelengths (300-1100nm), it's found that the energy gap and transmittance decrease while absorbance and extinction coefficient increase with the doping.
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