Abstract
Thin films of cadmium zinc selenide (Cd 0.7Zn 0.3Se) were deposited on ITO substrate by electrodeposition technique. The as-deposited films were annealed at 200, 300 and 400 °C for 1 h in ambient air. Composition, surface morphology and structural properties of the as-deposited and annealed films were studied by EDX, SEM and X-ray diffraction techniques, respectively. The XRD study showed the cubic to hexagonal structural transition at 300 °C. The lattice parameters of different phases of the material were calculated from the XRD pattern. The optical absorption spectra were recorded within the range of 350–800 nm. The band gap energies of the films decreased from 2.05 to 1.74 eV with respect to annealing temperature.
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