Abstract
CuAlTe2 films have been prepared by sputtering onto water-cooled glass substrates and then heat treating under vacuum. The as-grown films exhibit p-type conductivity and a chalcopyrite structure with a preferential orientation in the (112) direction. The best crystallinity of the films was observed after annealing at 300°C. For these films, the lattice constants were found to be: a = 5.62 Å and c = 12.45 Å. However, the approximate value of the grain size may vary bettween 60 and 120 nm from the SEM picture. The direct band-gap value at room temperature was found to be 2.45 ± 0.02 eV for heat-treated films at 300°C.
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