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Abstract
We have grown CdTe/MnTe tilted superlattices by atomic layer epitaxy. These heterostructures are formed by depositing, in the step-flow growth mode, fractional monolayer superlattices (CdTe) m (MnTe) n , with p = m + n ≈ 1, onto 2° A and 2° B Cd 0.95Zn 0.05Te vicinal substrates. Transmission electron microscopy images reveal that we obtain a uniform short-range superlattice period and an in-plane modulation which is approximately 0.1 of that expected for perfect lateral atomic ordering. This reduced lateral modulation is evidenced by polarization anisotropy in optical experiments.
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