Abstract
Planar multilayer ZrO2:CeO2 slab waveguides were prepared by a sol–gel route and dip-coating technique onto commercial glass substrates. The coatings were microstructurally characterized by transmission electron microscopy (TEM), X-ray diffraction (XRD) and by optical confocal microscopy. Coating thicknesses of ca. 500nm and refractive index values of 2.069±0.001 and 2.087±0.001, respectively for TE and TM light polarization modes, were calculated by Dark m-line spectroscopy. This is consistent with the birefringent character of the coating, associated to the presence of anisotropic crystalline phases within the coating’s vitreous matrix. Finally, propagation losses of 0.9±0.2 and 1.5±0.2dB/cm were determined by the scattered light measurement for TE and TM polarization modes, respectively.
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