Abstract
Ultra-thin crystalline films of Bi-based chalcogenides were deposited with the aid of vacuum thermal evaporation technique. The influence of thermal annealing on the optical properties of Bi2Te3-Bi2Se3 films with different thicknesses has been investigate. Optical transmittance and reflectance of the as prepared and annealed films were measured in the wavelength range 290–2700 nm using a double beam spectrophotometer. Fundamental optical properties such as absorption coefficient and energy bend gap were derived based on the measured spectra and film’s thickness. We demonstrate in the present work that the synergy of annealing and thickness reduction can be exploited for light transmittance enhancements, and consequently optoelectronic applications including transparent electrode can be achieved.
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