Abstract
PbTe/Pb 0.88Sn 0.12Te superlattices ( dpbTe = dpbSnTe = 300–2000 A, up to 40 layers) were produced by modified hot wall technique. The films were analysed by X-ray diffractometry and it turns out that the p-PbSnTe layers are under tensile strain. Shubnikov-De Haas and cyclotron resonance measurements were performed. An analysis within the framework of the envelope function approach yields information on the electronic subbands and their anisotropy.
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