Abstract
The polycrystalline sample of a ternary system of 0.5BF-0.25ST-0.25BT (i.e., Bi0.5Ba0.25Sr0.25)(Ti0.5Fe0.5)O3 was prepared via a conventional high-temperature solid-state reaction technique. The preliminary structural analysis using room temperature X-ray diffraction (XRD) data shows the tetragonal as well as pseudo-cubic nature of the compound. Analysis of temperature and frequency-dependent dielectric parameters, obtained in a wide range of temperature and frequency, exhibits diffused phase transition with relaxor-ferroelectric nature of the material. This observation has been confirmed through temperature and frequency evolved P-E loops. The sample is free from impurities and is structurally stable. The Vogel-Fulcher plot was used to confirm the relaxor type of ferroelectric behavior of the material. The dielectric relaxation, grain, grain-boundary contribution, and semiconductor (negative temperature coefficient of resistance) nature of the compound have been analysed through impedance analysis. The current-voltage (I-V) and leakage characteristics confirm the bulk limited (SCLC) and interface limited (Schottky, Poole-Frankel emitted and Fowler-Nordheim type) conduction mechanisms. The energy bandgap, calculated from the I-V-spectra, is found to be 0.93 eV in the particular (high) temperature range indicating the semiconducting nature of the material.
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