Structural and dielectric properties of SrFexTi1-xO3 (x = 0.001, 0.005 and 0.01) ceramics

Abstract

Three different SrFe x Ti 1-x O 3(x = 0.001, x = 0.005, x = 0.01) ceramics were prepared by the conventional solid-state reaction. The crystalline structure, surface morphology and dielectric properties were studied by X-ray diffraction (XRD), scanning electron microscope (SEM) and Agilent 4294A impedance analyzer, respectively. It is shown that both the sintering temperature and doping concentration influence the lattice constant, grain size, dielectric constant and the dielectric loss. When the sintering temperature is higher than 1390°C, the lattice constant, grain size and dielectric constant all decrease with the increase of the doping concentration, except the dielectric loss tangent which shows the opposite trend. Leakage current tests show that the leakage current density falls down with the increase of Fe doping concentration in the given region.