Abstract
Very detailed flux creep and relaxation measurements of intragrain magnetization in sintered high- T c superconductors at 4.2 K are presented. The M-relaxation rate is not a single valued function of the applied B-field but depends strongly on the prior magnetic field cycling procedure. The largest relaxation rate is measured on the envelope curves of the M-hysteresis area. On the transition curves (minor loops) the relaxation rate is reduced and even disappears locally. This is of great importance for applications of high- T c superconductors in electronics. The results can also be applied to low- T c superconductors like NbTi and are of interest for accelerator magnets with superconducting windings. Theoretical expressions for the relaxation process are derived for all physically relevant parts of the M-hysteresis curve on the basis of Bean's model. As the grain M influences also the integrain critical transport current and microwave absorption granular high- T c material, our results on M-relaxation behavior are a basis to explain the already observed time dependence of those phenomena.
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