Abstract
We report detailed investigations of a strong perpendicular magnetic anisotropy in Ni0.8Fe0.2 thin films originating from interfaces with adjacent Ru and SiO2 layers. The anisotropy is quantified using broadband ferromagnetic resonance measurements for three types of layered heterostructures, namely an asymmetric structure of SiO2/Ni0.8Fe0.2/Ru and symmetric structures of Ru/Ni0.8Fe0.2/Ru and SiO2/Ni0.8Fe0.2/SiO2. The results show a stronger perpendicular anisotropy at the Ni0.8Fe0.2/SiO2 interface than at the Ni0.8Fe0.2/Ru interface and a lower interfacial damping contribution for the Ni0.8Fe0.2/SiO2 interface compared to the Ni0.8Fe0.2/Ru interface.
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