Abstract

When two fluids of different electrical conductivities are transported under the influence of an electric field, the electrokinetic instability (EKI) phenomenon often triggers in a microfluidic device once the electric field strength and conductivity gradient exceed some critical values. This study presents a detailed numerical investigation of how the rheological behavior of a fluid obeyed by the non-Newtonian power-law constitutive relation could influence this EKI phenomenon in a microfluidic T-junction. We find that as the fluid rheological behavior changes from shear-thickening (n >1) to shear-thinning (n <1), the EKI phenomenon is significantly influenced under the same conditions. In particular, the intensity of this EKI phenomenon is found to be significantly higher in shear-thinning fluids than in Newtonian and shear-thickening fluids. Also, the critical value of the applied electric field strength for the inception of this EKI phenomenon gradually increases as the fluid rheological behavior progressively moves from shear-thinning to shear-thickening. The corresponding mixing phenomenon, often achieved using this EKI phenomenon, is also notably higher in shear-thinning fluids compared to Newtonian and shear-thickening fluids. A detailed analysis of both the flow dynamics and mixing phenomena inside the microdevice is presented and discussed in this study. To perform so, we also employ the data-driven dynamic mode decomposition technique, considered one of the widely used reduced-order models to analyze a dynamical system. This analysis facilitates a better understanding of the EKI-induced chaotic convection and mixing phenomena inside the microdevice. We observe that the spatial expanse and intensity of the coherent flow structures differ significantly as the power-law index changes, thereby providing valuable insight into certain aspects of the underlying flow dynamics that, otherwise, are not apparent from other analyses.

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