Abstract
Abstract The interlayer exchange coupling properties of perpendicular synthetic antiferromagnetic (p-SAF) structure were investigated in this work by varying the Ru spacer thickness (tRu). We observed an oscillatory decay of interlayer exchange coupling field (Hex) and coupling strength (Jex) with a period of about 0.6 nm. The greatest values of Hex and Jex are 13.2 kOe and 1.77 erg/cm2 at the 1st peak, respectively. The Hex decreases significantly to about 6.2 kOe with the increase of tRu from 0.44 nm at the 1st peak to 1.03 nm at the 2nd peak. The effect of post-annealing temperature on the Hex was also investigated. The Hex decreases with the increase of annealing temperature. Furthermore, after annealing at 380 °C, the Jex value remains as high as 0.94 erg/cm2 at the 1st peak. Our results represent a candidate for spin-transfer torque magnetic random-access memory (STT-MRAM).
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