Abstract
Abstract We have measured by X-ray resonant magnetic scattering the stripe domain nucleation field and the stripe domain critical width of FePd epitaxial films in a wide temperature range. A detailed quantitative analysis of our data in the framework of the rigorous theory of domain nucleation in thin films, allowed to determine the temperature dependence of both the exchange stiffness A and the anisotropy constant K u . The proposed approach can be applied to thin magnetic films with perpendicular magnetic anisotropy, thus providing a way to measure A in a relevant class of magnetic materials.
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