Stress-Strain Relationship and XRD Line Broadening in [0001] Textured Hexagonal Polycrystalline Materials

Abstract

Stress analysis with X-ray diffraction (XRD) for hexagonal polycrystalline materials in the Laue classes 6/mmm and 6/m has been studied on the basis of the crystal symmetry of the constituent crystallites which was proposed by R. Yokoyama and J. Harada [“Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture”, Journal of Applied Crystallography, Vol.42, pp.185-191 (2009)]. The relationship between the stress and strain observable by XRD in a hexagonal polycrystalline material with [0001] fibre texture was formulated in terms of the elastic compliance defined for its single crystal. As a result, it was shown that the average strains obtained in the crystallites for both symmetries of 6/mmm and 6/m are different from each other under the triaxial or biaxial stress field. Then, it turned out that the line width of XRD changes depending on the measurement direction.