Abstract
The development of stress in evaporated dielectric and metal films, used as optical coatings, has been investigated experimentally by observing the bending of a thin silica strip as it becomes coated. The strip forms one mirror of a laser interferometer mounted within the coating chamber, giving high measurement sensitivity. Stress data on a number of materials commonly used in coating are presented, and the behavior of multilayer coatings investigated. Analysis of the effect of film stress upon the figure of optical surfaces is given, and the influence of stress upon the mechanical stability of multilayers is discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
