Stress-driven grain growth in nanocrystalline Pt thin films

Abstract

Microtensile experiments and electron microscopy have been utilized to characterize the mechanical behavior of nanocrystalline Pt films. The behavior can be described as high strength with limited strain to failure. The tensile deformation triggers a microstructural evolution increasing the grain size from 20 nm in the initial state to 33 nm in the deformed state. This observation of grain growth at a homologous temperature of 0.146 provides further evidence of the role of mechanical stress in initiating grain growth in nanocrystalline metals.