Abstract
The evolution of stresses in a heteroepitaxial $({\mathrm{Ba}}_{0.7}{\mathrm{Sr}}_{0.3}){\mathrm{TiO}}_{3}/(001)\mathrm{MgO}$ thin film was studied by means of micro-Raman spectroscopy. A small part of the substrate was gradually dissolved, then partially unsupported and completely free-standing areas of the film were studied in a side-view backscattering geometry. The E(TO) soft mode was used to estimate local stresses in the thin film. Our experiments revealed stress relaxation and the gradient of the tetragonal distortion in the partially unsupported ferroelectric thin film. The length scale over which the stress relaxes in the heteroepitaxial film was estimated. The thermal strain arising mostly due to the difference between the thermal-expansion coefficients of the film and the substrate governs the domain structure and induces enhanced tetragonality in the film studied. We found that the partially unsupported thin film is polarization graded due to the stress gradient along the film-substrate interface.
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