Abstract
Abstract Stress-induced optical retardation at λ = 1.8 μm in GeAsSe chalcogenide glass disks subjected to a diametral compressive load was measured using a modified IR-polarizing microscope. The computed stress-optic coefficient, B, varied from −29.6 to +5.4 TPa−1 over the glass-forming region. Although the magnitude of B appeared to decrease with increasing Ge content, there appeared to be little direct correlation between B and the average coordination number, 〈(ifr)〉.
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