Abstract
Validity criteria are presented for use of moiré interferometry as a means to obtain near tip crack data combined with the use of a truncated two parameter, displacement based, K IC eigenfunction extraction method. Comparison is made with standard ASTM plane strain fracture toughness test methods for a three point bend specimen of 15V-3Cr titanium. Agreement between the experimental and ASTM plane strain K IC is found even though surface data were used. Quantitative explanations of this agreement are postulated, based on extreme near tip data extraction, the theoretical three-dimensional free surface crack tip eigenvalue for a relatively low Poisson ratio material and a direct measurement of this eigenvalue based on measured displacement.
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