Abstract
X-ray residual stress analysis is a widespread nondestructive technique to investigate the residual stress and residual stress gradient in thin films and protective coatings.In the present contribution we introduce a new method based on the noncomplanar measurement geometry that allow to span large area of sin2ψ and penetration depth values without sample inclination. The refraction correction and absorption is considered in details for the noncomplanar measurements. The proposed technique is applied to determine stress gradients of blasted hard TiN coatings.
Highlights
To investigate residual stresses nondestructively, X-ray diffraction (XRD) analysis based on the sin2 ψ method is usually used
In the traditional sin2 ψ plots each ψ value corresponds to different penetration depth and in the case of thin layers with the presence of stress gradient resulting in deviation from linear behavior
In order to check the approach of stress gradients measurements outlined above and evaluate importance of refraction corrections we have investigated residual stress state in the hard TiN coating
Summary
To investigate residual stresses nondestructively, X-ray diffraction (XRD) analysis based on the sin2 ψ method (dependence of the deformations from the sin2 ψ value [1]) is usually used. In the traditional sin2 ψ plots each ψ value corresponds to different penetration depth and in the case of thin layers with the presence of stress gradient resulting in deviation from linear behavior. Using special set-up with help of so called scattering vector method [4] one may perform the stress measurements at fixed penetration depth, i.e. can obtain more reliable results.
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