Abstract
ABSTRACT The effect of uniaxial stress on Bi3.25La0.75Ti3O12 (BLT) thin films annealed at two different temperatures of 700°C and 800°C were studied. It was observed that the films annealed at 800°C had lager remnant polarization (P r) compared with that annealed at 700°C under either applied stress or not. However, the tendency of change about the remnant polarization and the coercive field with stress in both films was very similar. That is to say, the remnant polarization increased with tensile stress, but decreased with compressive stress; On the contrary, the coercive field decreased with the stress changing from maximum compression to maximum tension in films. The above results are thought to originate from the grain integrity and the reorientation of domains in films under stress.
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