Abstract
It has been observed in photoelectric devices that stresses and strains can cause inhomogeneous distribution of the refractive index which affects their performance. The purpose of this paper is to study the stress effect on the behavior of optical waveguide sensor containing a dielectric film sandwiched between a linear substrate and a nonlinear cladding. The cladding refractive index profile is assumed to have Kerr like intensity dependence. The effective refractive indices and mode shapes of the optical waveguide sensor subject to different stress states are calculated analytically. The effect of such variation on the light intensity and implications on the sensor sensitivity are investigated. It is found that stress can affect the optical sensitivity performance.
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