Abstract
A model where stress-birefringence associated with a facet is due to strain induced by lattice mismatch between the facet and the surrounding off-facet regions is proposed. In order to prove the validity of the model, the stress-birefringence associated with 〈211〉 facets of pure YAG grown by the Czochralski (CZ) method and pure NdGG grown by the floating zone (FZ) method was measured using two different methods: (1) using a “rectifier” polarizing microscope with a Brace-Köhler compensator and (2) Sénarmont's method using a He-Ne laser. The results of the quantitative measurements supported the validity of the mode. The experimental result, moreover, that the stress-birefringence associated with a facet of YAG was decreased by Cr 2O 3 doping also supported it.
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