Abstract
At low‐temperature and high‐stress conditions, quartz deformation is controlled by the kinetics of dislocation glide, that is, low‐temperature plasticity (LTP). To investigate the relationship between intracrystalline H2O content and the yield strength of quartz LTP, we have integrated spherical and Berkovich nanoindentation tests at room temperature on natural quartz with electron backscatter diffraction and secondary‐ion mass spectrometry measurements of intracrystalline H2O content. Dry (<20 wt ppm H2O) and wet (20–100 wt ppm H2O) crystals exhibit comparable indentation hardness. Quartz yield strength, which is proportional to indentation hardness, seems to be unaffected by the intracrystalline H2O content when deformed under room temperature, high‐stress conditions. Pre‐indentation intracrystalline microstructure may have provided a high density of dislocation sources, influencing the first increments of low‐temperature plastic strains. Our results have implications for fault strength at the frictional‐viscous transition and during transient deformation by LTP, such as seismogenic loading and post‐seismic creep.
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