Abstract
The structure and substructure of thin films of Al, Ag, Ge, and Ni with thicknesses in the range 100 to 700 A, are investigated using an electron microscope and electron diffraction techniques. The results are compared with a previous determination of the thickness-dependence of the strength of the films [1]. The structure and substructure of Au, Ag, and Ge films of uniform thickness (about 200 to 300 A) are changed by various heat treatments following the measurement of their strength. The origin of the higher strength of the films is discussed on the basis of the results obtained. [Russian Text Ignored].
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