Abstract
We describe the process through which stray light analysis should be performed in optical systems involving image slicers. We detail how scattering models should be used depending on how the image slicer assembly will be fabricated. Our work describes how to determine all ray paths, compute cross-talk on the pupil mirrors due to scattering, quantify the ghost images’ intensity, and determine baffle positions. In the example given, an ABg model is applied to all mirror arrays separately, before considering their contributions altogether. We also consider diffraction due to the image slicer’s narrow slice apertures, which contribute to unwanted light in the system by causing cross-talk on the pupil mirrors. Using Fourier optics, this quantity is computed and compared with cross-talk caused by scattering. Our work represents a useful asset for optical engineers who work on image slicer-based systems and want to analyze stray light, by providing a clear and exhaustive procedure to follow to obtain accurate estimates.
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