Abstract

One advantage of microconcentrator photovoltaics (μ-CPV) is the range of possible circuit connection arrangements. Large numbers of cells can be connected in combinations of series and parallel strings, which can provide a means to protect the module against performance loss due to cell failure, cell shading, and other variations in cell parameters that may arise during the fabrication and wiring processes. We introduce a model to evaluate the best strategy for optimizing module reliability through circuit layout using a combination of series and parallel connected cell strings. The model uses realistic solar cell device parameters in an electrical network simulation, coupled with a Monte Carlo method to introduce defects into the array with different probabilities. We use the model to optimize the layout of a μ-CPV panel designed to be integrated with the conventional 60-cell crystalline silicon panels for diffuse light capture to produce a hybrid direct/diffuse CPV product.

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