Abstract
In this paper, a strategic approach is provided for simultaneously assessing the verification and validation (V&V) test results and the reliability information during product development based on the perspective of the partially accelerated degradation test (PADT) scheme. This approach addresses the obstacle of obtaining prior information on the model parameters for conducting PADT while minimizing the asymptotic variance of the acceleration model parameters. The strategic advantages and characteristics of the PADT, which do not exist in the classical accelerated test (AT) and partially accelerated test (PAT), are presented. In addition, the advantages and suitability of adopting the PADT instead of the partially accelerated life test (PALT) for effectively assessing the reliability information during product development are investigated through illustrative examples.
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