Abstract
X-ray diffraction, resistivity, and susceptibility measurements are used to examine the effects of film thickness d (from 17 to 250 nm) on the structural and superconducting properties of La1.85Sr0.15CuO4 films grown by pulsed laser deposition on SrLaAlO4 substrates. For each d the film sgrow with a variable strain, ranging from a large compressive strain in the thinnest films to a negligible or tensile strain in thick films. Our results indicate that the tensile strain is not caused by the off-stoichiometric layer at the substrate–film interface. Instead, it may be caused by the extreme oxygen deficiency in some of the films.
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