Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD

Abstract

The strain profile in the subsurface of He-ion-irradiated W was figured out by unfolding the synchrotron-grazing incidence X-ray diffraction (S-GIXRD) patterns at different incidence angles. The results show that for 2 × 1021 ions/m2 He2+-irradiated W, in addition to a compressive strain exists in the depths of 0–100 nm due to mechanical polishing, an expansion strain appears in the depth beyond 100 nm owing to irradiation-induced lattice swelling. This work provides a reference for the study of irradiation damage in the subsurface by S-GIXRD.