Abstract
Superconducting ultrathin films grown epitaxially onto crystalline substrates exhibit strained epitaxial growth due to lattice mismatch, which can have a significant effect on their superconducting properties. We present a complete correlation of the surface morphology, crystal growth, strain, microstructure, and superconducting properties in single-crystal Nb(110) thin films sputter deposited on a-plane sapphire substrates. Notably, we observe that the lattice mismatch between Nb and sapphire induces the formation of a hexagonal surface structure during the first three atomic layers. This is followed by a strained bcc Nb(110) phase whose in-plane lattice parameter progressively relaxes to bulk value. Similar lattice relaxation was also observed in the direction perpendicular to the interface using X-ray diffraction (XRD) and transmission electron microscopy (TEM). Significant perpendicular strain in films up to 30 nm thick was found to ultimately affect the superconducting properties of the Nb thin films...
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
