Abstract
We have grown epitaxial La2/3Sr1/3MnO3 (LSMO) and La2/3Ba1/3MnO3 (LBMO) thin films as well as La2/3Ba1/3MnO3/SrTiO3 heterostructures by pulsed-laser deposition. The microstructure of the films was analyzed by x-ray diffraction and transmission electron microscopy. A significant effect of strain due to lattice mismatch was found. Whereas the thick LBMO films show perfect epitaxy and grow coherently strained over the full film thickness, the LSMO films were found to be composed of two layers separated by an intrinsic interface region containing a high density of defects. The approximately 60 nm thick bottom layer grows coherently on the SrTiO3 (STO) substrate and is highly strained, whereas the top layer is almost strain free. The LBMO/STO heterostructures are coherently strained and show a very low density of defects and sharp interfaces.
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