Abstract
A series of Pb1−xEuxTe/PbTe multi-quantum well (MQW) samples were grown on (111) cleaved BaF2 substrates by molecular beam epitaxy. The Eu content was maintained at x∼0.05–0.06 and the PbTe well width was varied from 23 to 206 Å. The samples were characterized structurally by high resolution x-ray diffraction in the triple axis configuration. The ω/2Θ scans of the (222) Bragg reflection showed very well resolved satellite peaks up to the tenth-order for all samples indicating that sharp interfaces were obtained. Reciprocal space mapping around the (224) lattice point indicated that the MQW structure tended to the free-standing condition. The (222) ω/2Θ scans were calculated by dynamical theory of x-ray diffraction and compared to the measured ones. Using the in-plane lattice constant as the main fitting parameter, the strain in the PbTe well inside the MQW structure was obtained as a function of its width. It decreased monotonically from an almost fully strained layer to 26% of strain relaxation as the PbTe well increased from 23 to 206 Å.
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