Storage reliability estimation of one-shot systems using accelerated destructive degradation data

Abstract

A gamma process model is widely used to estimate reliability of general systems using non-destructive degradation data. However, the daunting challenge is the application of the model to one-shot systems given that recursive measurements are unavailable and degradation trends over time are nonlinear. This study shows a storage reliability estimation method of one-shot systems using accelerated destructive degradation data when information of either chemical reaction or degradation trend is unknown. An n-th kinetic model, which is a Physics-based model, was used to evaluate the degradation phenomenon of one-shot systems using destructive degradation data. The accelerated degradation model was constructed to estimate storage reliability for normal storage temperature. The proposed method was applied to estimate storage reliability of IR flare using the stabilizer contents that were destructively measured over time at three temperature levels. The real application results show applicability of the proposed method.