Stochastic Ordering Results on Implied Lifetime Distributions under a Specific Degradation Model

Abstract

In this paper, a novel strategy is employed in which a degradation model affects the implied distribution of lifetimes differently compared to the traditional method. It is recognized that an existing link between the degradation measurements and failure time constructs the underlying time-to-failure model. We assume in this paper that the conditional survival function of a device under degradation is a piecewise linear function for a given level of degradation. The multiplicative degradation model is used as the underlying degradation model, which is often the case in many practical situations. It is found that the implied lifetime distribution is a classical mixture model. In this mixture model, the time to failure lies with some probabilities between two first passage times of the degradation process to reach two specified values. Stochastic comparisons in the model are investigated when the probabilities are changed. To illustrate the applicability of the results, several examples are given in cases when typical degradation models are candidates.