Stochastic Geometrical and Microstructural Modeling for Solid Oxide Cell Electrodes

Abstract

As it plays a key role on the performances and durability of solid oxide cells, the electrode microstructure has to be finely characterized and modelled. In this frame, a plurigaussian random field model and an original sphere packing algorithm have been developed to simulate a large variety of electrode microstructures. The two stochastic geometrical models have been validated on various electrode reconstructions obtained by synchrotron X-ray holotomography including the microstructures of thin functional layers and a thick current collector. Afterwards, semi-analytical microstructural correlations have been proposed and validated on a large dataset of representative synthetic microstructures. These equations allow establishing the links between the microstructural properties controlling the performances (Triple Phase Boundary lengths density and specific surface areas) to the ‘basic’ geometric attributes of the electrode (composition, porosity and particle size distribution). These correlations have been used to model the loss of active TPBl due to the Ni agglomeration.